Dia-Stron return to JEC World 2022

The Dia-Stron team are back in Paris from 3rd-5th May exhibiting at JEC World on stand N4 in the SME Village.

Yann Leray, Maud Dumas and Chen Zhou will be on hand to discuss our latest release fibra.stress, as well as our unique interfacial shear strength instrument LEX-IFSS.

Please stop by our booth to find out more about our exciting instrument range for single fibre and fibre/matrix measurements – we look forward to seeing you there!